JEOL Scanning Electron Microscope

Alt=JEOL Scanning Electron MicroscopeSrc=/sites/partnerships.charlotte.edu/files/media/5259-1.jpgJEOL Scanning Electron Microscope

The JSM-6610 is a high-performance scanning electron microscope for fast characterization and imaging of fine structures on both small and large samples. One of a family of four SEM models that are widely-used in all research fields and industrial applications, the JSM-6610 enables observation of specimens up to 200mm in diameter.